题 目：Sensing through tissue: imaging implant
associated infection, and monitoring bone healing
报告人：Dr. Jeffrey Anker
时 间：2018年5月23日（上午 10:00~ ）
Jeffrey Anker is a Wallace R. Roy Associate Professor of Chemistry and BioEngineering at Clemson University. He obtained his BS degree in applied physics at Yale University in 1998. He received his doctorate at The University of Michigan in 2005 under Raoul Kopelman，s guidance, and his postdoc at Northwestern University under Richard Van Duyne,s guidance. Current research focuses on imaging and spectroscopy using magnetic, plasmonic, and X-ray excited micro- and nano-sensors.